Effect of Top-Gate dielectric deposition on the performance of Indium Tin Oxide Transistors

Wahid, Sumaiya (Corresponding author); Daus, Alwin; Kwon, Jimin; Qin, Shengjun; Ko, Jung-Soo; Wong, H. -S. Philip; Pop, Eric

New York, NY : IEEE (2023)
Journal Article

In: IEEE electron device letters
Volume: 44
Issue: 6
Page(s)/Article-Nr.: 951-954

Institutions

  • Chair of Electronic Devices [618710]

Identifier