Resistive Switching and Current Conduction Mechanisms in Hexagonal Boron Nitride Threshold Memristors with Nickel Electrodes

Völkel, Lukas; Braun, Dennis; Belete, Melkamu Adgo; Kataria, Satender; Wahlbrink, Thorsten; Ran, Ke; Kistermann, Kevin; Mayer, Joachim; Menzel, Stephan; Daus, Alwin (Corresponding author); Lemme, Max C. (Corresponding author)

Weinheim : Wiley-VCH (2023)
Journal Article

In: Advanced functional materials
Page(s)/Article-Nr.: 2300428

Institutions

  • Central Facility for Electron Microscopy [025000]
  • Chair of Microstructure Analysis [025010]
  • JARA - FIT [080009]
  • Department of Physics [130000]
  • Chair of Electronic Devices [618710]

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