High-resolution Terahertz near-field measurements for 2D-material inspection in reflection-mode geometry

Sawallich, Simon; Quellmalz, Arne; Michalski, Alexander; Lemme, Max C.; Nagel, Michael

Piscataway, NJ] : IEEE (2022)
Contribution to a book, Contribution to a conference proceedings

In: IRMMW-THz 2022 : 47th International Conference on Infrared, Millimeter and Terahertz Waves : 28 August-2 September 2022, TU Delft, The Netherlands / conference chair: Nuria Llombart (Delft University of Technology)
Page(s)/Article-Nr.: 1-2

Institutions

• Chair of Electronic Devices [618710]