AFM-Based Hamaker Constant Determination with Blind Tip Reconstruction

Ku, Benny; van de Wetering, Ferdinandus; Bolten, Jens; Stel, Bart; van de Kerkhof, Mark A.; Lemme, Max C. (Corresponding author)

Weinheim : Wiley (2022)
Journal Article

In: Advanced materials technologies
Page(s)/Article-Nr.: 2200411

Institutions

  • Chair of Electronic Devices [618710]

Identifier

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