Wafer-scale inspection of graphene conductivity by THz near-field scanning : As-grown on sapphire and after transfer to SiO2/Si

Michalski, Alexander; Sawallich, Simon; Krotkus, Simonas; Pandey, Himadri; Kataria, Satender; Heuken, Michael; Conran, Ben; McAleese, Clifford; Nagel, Michael; Lemme, Max C.

Piscataway, NJ] : IEEE (2020, 2021)
Contribution to a book, Contribution to a conference proceedings

In: 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) : November 8-13, 2020, a virtual event hosted from Buffalo, New York, USA / conference chair: Andrea Markelz (University at Buffalo)
Page(s)/Article-Nr.: 1 Seite


  • Chair of Electronic Devices [618710]