Dependable Contact Related Parameter Extraction in Graphene-Metal Junctions

Gahoi, Amit; Kataria, Satender; Driussi, Francesco; Venica, Stefano; Pandey, Himadri; Esseni, David; Selmi, Luca; Lemme, Max C. (Corresponding author)

Weinheim : Wiley-VCH Verlag GmbH & Co. KG (2020)
Journal Article

In: Advanced electronic materials
Volume: 20
Issue: 10
Page(s)/Article-Nr.: 2000386

Institutions

  • MICA - Advanced Microelectronic Center Aachen [052600]
  • Chair of Electronic Devices [618710]

Identifier

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