Direct observation of grain boundaries in graphene through vapor hydrofluoric acid (VHF) exposure
Fan, Xuge; Wagner, Stefan; Schädlich, Philip; Speck, Florian; Kataria, Satender; Haraldsson, Tommy; Seyller, Thomas; Lemme, Max C. (Corresponding author); Niklaus, Frank (Corresponding author)
Washington, DC [u.a.] : American Association for the Advancement of Science (2018)
Journal Article
In: Science advances
Volume: 4
Issue: 5
Page(s)/Article-Nr.: eaar5170 1-9
Institutions
- Chair of Electronic Devices [618710]
Identifier
- DOI: 10.1126/sciadv.aar5170
- DOI: 10.18154/RWTH-2020-07660
- RWTH PUBLICATIONS: RWTH-2020-07660