Dependability Assessment of Transfer Length Method to Extract the Metal-Graphene Contact Resistance

Driussi, Francesco (Corresponding author); Venica, Stefano; Gahoi, Amit; Kataria, Satender; Lemme, Max C.; Palestri, Pierpaolo

New York, NY : IEEE (2020)
Journal Article

In: IEEE transactions on semiconductor manufacturing
Volume: 33
Issue: 2
Page(s)/Article-Nr.: 210-215

Institutions

  • Chair of Electronic Devices [618710]

Identifier