Photoelectric Measurements of the Modern Graphene-Insulator-Semiconductor (GIS) Test Structures

Piskorski, Krzysztof; Przewlocki, Henryk M.; Passi, Vikram; Ruhkopf, Jasper; Lemme, Max C.

Piscataway, NJ] : IEEE (2018)
Contribution to a book, Contribution to a conference proceedings

In: Proceedings of 25th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2018 : Gdynia, Poland, June 21-23, 2018 / organised by: Department of Microelectronics and Computer Sicence, Lodz University of Technology (Poland), Department of Marine Electronics, Gdynia Maritime University (Poland), Institute of Microelectronics and Optoelectronics, Warsaw University of Technology (Poland) ; edited by Andrzej Napieralski
Page(s)/Article-Nr.: 319-323


  • Chair of Electronic Devices [618710]