Photoelectric Measurements of the Modern Graphene-Insulator-Semiconductor (GIS) Test Structures
Piskorski, Krzysztof; Przewlocki, Henryk M.; Passi, Vikram; Ruhkopf, Jasper; Lemme, Max C.
Piscataway, NJ] : IEEE (2018)
Contribution to a book, Contribution to a conference proceedings
In: Proceedings of 25th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2018 : Gdynia, Poland, June 21-23, 2018 / organised by: Department of Microelectronics and Computer Sicence, Lodz University of Technology (Poland), Department of Marine Electronics, Gdynia Maritime University (Poland), Institute of Microelectronics and Optoelectronics, Warsaw University of Technology (Poland) ; edited by Andrzej Napieralski
- Chair of Electronic Devices