Reliability analysis of the metal-graphene contact resistance extracted by the transfer length method

Venica, Stefano (Corresponding author); Driussi, Francesco; Gahoi, Amit; Kataria, Satender; Palestri, Pierpaolo; Lemme, Max C.; Scimi, Luca

Piscataway, NJ] : IEEE (2018)
Contribution to a book, Contribution to a conference proceedings

In: ICMTS 2018 : proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures : 31st ICMTS, March 19-22, 2018, Courtyard by Marriott Austin Downtown/Convention Center, Austin, Texas, USA / ICMTS ; sponsored by the IEEE Electron Devices Society

Institutions

• Chair of Electronic Devices [618710]