Properties of Metal/High-k Oxide/Graphene Structures

Engström, Olof; Lemme, Max C.; Habibpour, Omid

Pennington, NJ, USA : ECS - The Electrochemical Society (2017)
Contribution to a book, Contribution to a conference proceedings

In: Semiconductors, Dielectrics, and Metals for Nanoelectronics 15: In Memory of Samares Kar / editors: D. Misra, S. De Gendt, M. Houssa, K. Kita, D. Landheer ; sponsoring division: Dielectric Science & Technology
Page(s)/Article-Nr.: 157-176


  • Chair of Electronic Devices [618710]