Wafer-Scale Statistical Analysis of Graphene FETs—Part I: Wafer-Scale Fabrication and Yield Analysis

Smith, Anderson D. (Corresponding author); Wagner, Stefan; Kataria, Satender; Malm, B. Gunnar; Lemme, Max C.; Ostling, Mikael

New York, NY : IEEE (2017)
Journal Article

In: IEEE transactions on electron devices
Volume: 64
Issue: 9
Page(s)/Article-Nr.: 3919-3926

Institutions

• Chair of Electronic Devices [618710]