Intrinsic and extrinsic corrugation of monolayer graphene deposited on SiO2

Geringer, Viktor; Liebmann, Marcus; Echtermeyer, T.; Runte, S.; Schmidt, M.; Rückkamp, R.; Lemme, Max C.; Morgenstern, Markus

Ridge, NY : American Physical Society (2009)
Journal Article

In: Physical review letters : PRL
Volume: 102
Issue: 7
Page(s)/Article-Nr.: 076102

Institutions

• MICA - Advanced Microelectronic Center Aachen [052600]
• JARA - FIT [080009]
• Department of Physics [130000]
• Chair of Experimental Physics (Solid State Physics) and II. Institute of Physics [132110]
• Chair of Experimental Physics (Solid State Physics) and Institute of Physics II [132310]
• Chair of Electronic Devices [618710]