Subthreshold behavior of triple-gate MOSFETs on SOI material

Lemme, Max C.; Mollenhauer, T.; Henschel, W.; Wahlbrink, T.; Baus, M.; Winkler, Olaf; Granzner, R.; Schwierz, F.; Spangenberg, B.; Kurz, Heinrich

Amsterdam [u.a.] : Elsevier (2004)
Journal Article

In: Solid state electronics : SSE
Volume: 48
Issue: 4
Page(s)/Article-Nr.: 529-534

Institutions

• Chair of Semiconductor Electronics and Institute of Semiconductor Electronics [616210]
• Chair of Electronic Devices [618710]